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Mots clés
Aluminum
ADSORPTION DESORPTION HYSTERESIS
Nuclear reaction analysis
Sputtering
Nickel
Raman spectroscopy
7630Lh
18O
Magnetization curves
Adsorption Isotherms
SiC
2H
Periodic multilayer
Adsorption
Alloys
Magnetic anisotropy
Interface defects
17Op
Thin films
Nitridation
Thin film
Nanoparticles
Silicon
Metal-insulator transition
Topological insulators
Al2O3
Isotopic Tracing
Ion beam analysis
Topological defects
Acoustic propreties of solid
Indium oxide
Pb centers
27Aldp
Ion implantation
RBS
Silicon carbide
Multilayer
Epitaxy
AC susceptibility
Silica
XRD
Ageing
Rutherford backscattering spectrometry RBS
18O resonance
Density functional theory
Energy loss
NRP
Transparent conductive oxide TCO
Oxygen deficiency
Passivation
6855Jk
Growth
HfO2
8140Ef
Annealing
3C-SiC
AFM
Channeling
27Ald p&α
Oxidation
Alloy
Ferromagnetic resonance
17O
Gold
Atomic Layer Deposition ALD
Adsorbed layers
X-ray diffraction
7550Pp
Nanostructures
Pulsed laser deposition
Stable isotopic tracing
EPR
Charge exchange
13C
Auger electron spectroscopy AES
Hysteresis
15N
Capillary condensation
Acoustic
Photoluminescence
Low energy electron diffraction LEED
27Alda
Defects
Gallium oxide
Silicon Carbide
XPS
Diffusion
GaMnAs
Measurement
7550Ee
Nuclear resonance profiling NRP
Kossel diffraction
Epitaxial growth
Zinc oxide
ALD
PIXE
17Opp
Evaluation
Magnetic semiconductors
Aluminium