Oxygen deficiency Topological insulators 13C Magnetization curves Measurement Ion implantation Evaluation 17Opp HfO2 RBS Defects Silicon Carbide 15N Adsorption Isotherms Interface defects Charge exchange 27Alda Adsorption 17Op ADSORPTION DESORPTION HYSTERESIS Thin film 2H 7550Pp Nanoparticles Kossel diffraction X-ray diffraction Annealing Gold Isotopic Tracing Nanostructures Aluminium 8140Ef Magnetic anisotropy Magnetic semiconductors Photoluminescence 27Ald p&α XRD SiC Low energy electron diffraction LEED Ageing Epitaxial growth Nickel Silicon carbide XPS Periodic multilayer 6855Jk Hysteresis GaMnAs 18O Multilayer Pb centers Capillary condensation Ion beam analysis Gallium oxide 18O resonance Nuclear reaction analysis Indium oxide Thin films Alloy Adsorbed layers Passivation NRP Epitaxy Sputtering Al2O3 ALD 3C-SiC Transparent conductive oxide TCO 17O PIXE Aluminum Diffusion Growth Zinc oxide Acoustic propreties of solid Acoustic Nitridation Silicon Stable isotopic tracing Channeling AC susceptibility Raman spectroscopy Atomic Layer Deposition ALD Auger electron spectroscopy AES Pulsed laser deposition Energy loss Nuclear resonance profiling NRP EPR Density functional theory Silica 27Aldp 7630Lh 7550Ee Oxidation AFM Ferromagnetic resonance Metal-insulator transition Rutherford backscattering spectrometry RBS Alloys Topological defects